XIS-3000 & XIS-4000
XIS (X-ray Inspection System) is an automated product quality control system using computerized x-ray image processing technology. XIS device can detect foreign objects such as metal, stone, glass, bone, as well as high density plastics. Also missing products and assembly defects from finished products can be detected.
XIS-3000 and XIS-4000 models are suitable for larger objects. The largest inspection width and height for XIS-3000 are 385mm and 215mm. For XIS-4000 the respective measurements are 595cm and 440cm
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