XIS-1000 & XIS-2000
XIS (X-ray Inspection System) is an automated product quality control system using computerized x-ray image processing technology. XIS device can detect foreign objects such as metal, stone, glass, bone, as well as high density plastics. Also missing products and assembly defects from finished products can be detected.
XIS-1000 and XIS-2000 models are suitable for small-sized products. The largest inspection width and height for XIS-1000 are 215mm and 130mm. For XIS-2000 the respective measurements are 300cm and 165cm
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